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Grüner
    

Dr. Daniel Grüner

Curriculum Vitae

Since 2010 Research fellow, Max-Planck-Institut für Chemische Physik fester Stoffe
2007-2010 Research fellow, Stockholm University, Department of Physical, Inorganic and Structural Chemistry
2002-2007 Doctorate (Dr. rer. nat.) in chemistry, Technische Universität Dresden
PhD Dissertation: Untersuchungen zur Natur der Laves-Phasen in Systemen der Übergangsmetalle (prepared at the Max-Planck-Institut für Chemische Physik fester Stoffe)
1997-2002 Diploma in chemistry, Dortmund University
Thesis: ”Solvothermalsynthese mit Seltenerdoxiden, -halogeniden und -oxidhalogeniden

Research Fields

Bone and Bone Replacement Materials

Micro- and ultrastructural studies of bone and bone replacements materials are carried out within a collaborative reseach project  "Transregio 79", funded by the Deutsche Forschungsgemeinschaft. The investigations focus on systemic bone diseases and bone-implant interfaces.

Electron Microscopy

Besides applying  scanning and transmission electron microscopy to a variety of materials, my research focuses on the development of imaging and preparation methods. This includes the application of low-voltage scanning electron microscopy to study beam-sensitive materials and the use of focused ion beam techniques to selectively prepare and study the delicate interfaces between materials with different mechanical properties.

Selected Publications

  1. Grüner, D.; Stein, F.; Palm, M.; Konrad, J.; Ormeci, A.; Schnelle, W.; Grin, Y.; Kreiner, G.:
    Preparation, phase stability and structure of the C36 Laves phase Nb1-xCo2+x
     Z. Kristallogr. 221 (2006) 319–333. (Open Access)
     
  2. Stein, F.; Jiang, D.; Palm, M.; Sauthoff, G.; Grüner, D.; Kreiner, G.:
    Experimental reinvestigation of the Co–Nb phase diagram
    Intermetallics 16 (2008) 785–792.
     
  3. Grüner, D.; Shen Z.:
    Direct Scanning Electron Microscopy Imaging of Ferroelectic Domains After Ion Milling
    J. Am. Ceram. Soc. 93 (2010) 48–50.
     
  4. Grüner, D.; Fäldt, J.; Jansson, K.; Shen Z.:
    Argon ion beam polishing: an elaborate preparation technique for evaluating the interface of osseointegrated implants with high resolution
    Int. J. Oral Maxillofac. Implants (2011), in press.
     
  5. Zhang, D. L.; Grüner, D.; Oleynikov, P.; Wan, W.; Hovmöller, S.; Zou, X. D.:
    Precession Electron Diffraction Using a Digital Sampling Method
    Ultramicroscopy 111 (2010) 47–55.

Contact

Daniel Grüner
Tel: +49 (0)351 4646-4211
Fax: +49 (0)351 4646-3002
E-Mail Daniel.Gruener[at]cpfs.mpg.de
Last modified on February 9, 2011 Print version         Top
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