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Metallography - Scanning electron microscopy
    

Scanning Electron Microscopy


  • SEM Philips XL30 with LaB6-cathode
  • acceleration voltage : 1 kV - 30 kV
  • Detectors:
    back scattered electron detector
    secondary electron detector (Everhardt-Thornley),
    STEM – detector
    Si-(Li)-detector for energy dispersive x-ray spectroscopy (EDXS)
  • shuttle transfer system for air-sensitive sample
The integrated EDXS-system (Phoenix V 5.29, EDAX) allows to detect almost all elements including boron. The EDXS analyses are usually performed standardless. Calculation of the chemical composition of the investigated phase uses matrices correction models ZAF, φZAF or φρz, implemented in the software package Genesis (EDAX). Quantifications of elements with small atomic number Z < 11 (Na) are not reliable with the standardless EDXS method.

local contact: Mrs. P. Scheppan

back to main page Hauptseite KG Metallographie

Last modified on July 27, 2009 Print version         Top
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