Scanning Electron Microscopy

• SEM Philips XL30 with LaB₆-cathode
• acceleration voltage : 1 kV - 30 kV
• Detectors:
  back scattered electron detector
  secondary electron detector (Everhardt-Thornley),
  STEM – detector
  Si-(Li)-detector for energy dispersive x-ray spectroscopy (EDXS)
• shuttle transfer system for air-sensitive sample

The integrated EDXS-system (Phoenix V 5.29, EDAX) allows to detect almost all elements including boron. The EDXS analyses are usually performed standardless. Calculation of the chemical composition of the investigated phase uses matrices correction models ZAF, φZAF or φρz, implemented in the software package Genesis (EDAX). Quantifications of elements with small atomic number Z < 11 (Na) are not reliable with the standardless EDXS method.

local contact: Mrs. P. Scheppan

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