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TEM / SEM - Scanning electron mycroscopy (SEM)
    

The institute´s activities on the field of scanning electron microscopy (SEM) and electron probe mico-analysis are centred in the Competence Group Metallography (Dr. U. Burkhardt). For morphology characterisation and for phase analysis by energy-dispersive x-ray spectroscopy (EDXS) a scanning electron microscope XL 30 is available. For more advanced analysis of metallographic micro-structures by wave-length dispersive x-ray spectroscopy (WDXS), a dedicated micro-probe analyser SX100 is used. In the Research Field Inorganic Chemistry the analytical equipment is complemented by an environmental scanning electron microscope Quanta 200 F (Dr. P. Simon). This microscope is used, on the one hand, for higher-resolution morphology imaging and, on the other hand, for in-situ experiments in the environmental or “wet” mode, mainly in the context of biomineralisation. All the machines mentioned are equipped with EDXS systems as well as with air-locks and transfer units to handle air-sensitive specimens.

Last modified on September 15, 2011 Print version         Top
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